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Tektronix 5-PS2 5-Series Prober Controller (2 Probe)
Tektronix 5-PS2 5-Series Prober Controller (2 Probe) streamlines semiconductor wafer-level testing by integrating a precision thermal calibration unit to ensure repeatable measurement accuracy when interfacing MSO 5-Series scopes with automated probing systems.
- Interface Capacity: Supports up to two simultaneous probes.
- Application Focus: Semiconductor device characterization.
- System Synergy: Exclusive for 5-Series MSO hardware.
- Automation Level: Fully compatible with automated wafer stations.
- Precision Standard: Designed for high-repeatability testing.
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Description
Tektronix 5-PS2 5-Series Prober Controller (2 Probe)
The Tektronix 5-PS2 is a specialized prober controller accessory engineered to deliver elite operational performance for interfacing 5-Series MSO oscilloscopes with automated wafer probing systems. By addressing the requirement for surgical technical integration in semiconductor testing, this unit utilizes a dual-channel architecture to effectively minimize measurement uncertainty during multi-point wafer-level audits. The metrological architecture of the 5-PS2 ensures absolute mechanical and electrical consistency, providing the high-fidelity oversight required for high-speed device characterization and repeatable sensor validation in cleanroom environments.
Built for industrial longevity, the 5-PS2 is a high-trust solution for managing stimulus in microelectronic development and silicon-level verification where precision is paramount. Its technical sophistication allows for the seamless automation of complex testing sequences, establishing it as a professional-grade metrology asset for speeding up development cycles and reducing manual handling errors. Providing the repeatable results and rigorous verification necessary for certifying semiconductor performance, this controller serves as the definitive tool for engineers requiring a robust and precise interface for high-density wafer probing applications.
Technical Specifications & Metrological Data
- System Integration: Specialized interface for 5-Series MSO and automated wafer prober synchronization.
- Probe Capacity: Supports simultaneous characterization of up to two high-performance probes.
- Application Logic: Optimized for wafer-level semiconductor testing and device characterization.
- Measurement Fidelity: Ensures precise and repeatable automated measurements in complex environments.
- Development Efficiency: Engineered to reduce cycle times in silicon validation and R&D.
- Structural Integrity: Robust mechanical design for long-term stability in cleanroom test setups.
- Metrological Utility: Vital tool for engineers requiring high-density, automated signal acquisition.
Tektronix 5-PS2 Metrology Specs
| Brand & Full Model SKU | Tektronix 5-PS2 (Prober Controller) |
|---|---|
| Country of Origin | USA |
| Bandwidth & Rise Time | N/A (Controller Module) |
| Analog & Digital Channels | Dual Probe Control Interface |
| Max Real-Time Sample Rate | N/A |
| Waveform Update Rate | N/A |
| Max Memory Depth | N/A |
| Vertical Resolution & High-Res Mode | N/A |
| Input Sensitivity & Noise Floor | Precision Positioning Feedback Loop |
| Timebase Range & Jitter | Synchronized Probe Actuation Timing |
| Hardware-Based Triggers | External Trigger Input/Output for Probing Synchronization |
| Protocol Analysis & Decoding | N/A |
| Spectral Analysis | N/A |
| Display & UI Architecture | Integrated with MSO 5 Series Touch UI |
| Connectivity & Interface | Dedicated Prober Connection Port |
| Multi-Instrument Integration | Controls semiconductor prober stations for automated testing |
| Standard Warranty & Service Interval | 1 Year Standard Warranty |
| Metrological Compliance | CE Compliant / Safety Rated for Lab Environment |
| Industrial Application | Wafer-level reliability testing, automated semiconductor characterization, and multi-point PCB probing. |
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